Altimet Altisurf 520 - Optical Profilometer and Roughness Measuring Tester

<p><b>Features And Benefits:&nbsp;</b></p><p>⦁ Measurement range (Z-axis): up to 350 µm<br>⦁ Resolution: Nanometer precision (down to 5 nm depending on sensor)<br>⦁ Scanning speed: Up to 300,000 points per second<br>⦁ Surface parameters: Ra, Rz, Rq, Sa, Sz, Sq, step height, waviness, flatness, form<br>⦁ Sensor compatibility: Chromatic confocal, interferometric, or hybrid (depending on configuration)<br>⦁ XY stage: Motorized, programmable for scanning of large parts<br>⦁ User software: Altimap – for intuitive control, real-time 3D visualization and data export</p><p></p><p><b>Typical Applications:&nbsp;</b></p><p>⦁ Micro-roughness analysis on metals, polymers, and ceramics<br>⦁ Topographical mapping of structured or coated surfaces<br>⦁ Step height and layer thickness measurement in MEMS and microelectronics<br>⦁ Quality control in surface finishing and material science<br>⦁ Research and development in thin films, printed electronics, and biomedical surfaces</p><p></p><p><b>Ideal For:&nbsp;</b></p><p>⦁ R&D laboratories<br>⦁ Surface engineering and material science teams<br>⦁ Precision manufacturing quality control<br>⦁ Printed electronics and thin film research<br>⦁ Biomedical device prototyping</p><ul></ul>