JEOL JSM-35CF Scanning Microscope w/XFR -180,000x Magnification

<p>Scanning Microscope <br></p> <p>10X - 180,000X Magnification</p> <p>Auto Focus</p><p><br></p><!--StartFragment--><li><strong>Eucentric Specimen Stage Features:</strong><p></p> <p></p> <ul><li><strong>Tilt:</strong> 0° to 60°</li><li><strong>Rotation:</strong> 360° (endless)</li><li><strong>X-axis Travel:</strong> 0 to 15 mm (along tilted plane)</li><li><strong>Y-axis Travel:</strong> 0 to 25 mm</li><li><strong>Z-axis Travel:</strong> 15 to 39 mm<ul><li>(fine adjustment option of 1.5 mm)</li></ul></li></ul> <p></p></li><li><strong>Focus Maintenance:</strong><p></p> <p></p> <ul><li>Image stays in focus during stage movements</li><li>Focus compensation for working distance change (15 mm to 39 mm)</li></ul> <p></p></li><li><strong>Specimen Accommodation:</strong><p></p> <p></p> <ul><li>Supports large specimens up to 76 mm in diameter and 20 mm in height (by swinging out the stage)</li></ul><p></p></li><!--EndFragment--><p><br><br></p> <p></p>